Test Probe Kits

ED&D test probe kits group selected accessibility probes and related test devices by standards family.

ED&D TPK-01 Accessibility Probe Kit featuring jointed finger probe, impact test ball, test pin, rigid finger probe, ball pressure tester, and telecom test probe in a foam-padded carrying case.

Selection note: confirm the governing standard, edition, clause, and required probe figures before ordering.

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TPK Series

Kit contents and calibration documentation differ by model.

TPK-01 Test Probe Kit

ED&D TPK-01 Accessibility Probe Kit featuring jointed finger probe, impact test ball, test pin, rigid finger probe, ball pressure tester, and telecom test probe in a foam-padded carrying case.

Standards references: IEC 60950, UL 60950, EN 60950, and CSA 950.

  • TFP-01 IEC Jointed Finger Probe with banana jack in handle
  • ITB-01 50 mm Impact Test Ball
  • TPP-01 Test Pin Probe, short
  • UFP-02 Rigid Finger Probe
  • BPT-01 Ball Pressure Tester
  • TTP-01 Telecom Test Probe
  • Custom-cut foam padded carrying case
  • ISO/IEC 17025 accredited certificate of calibration with specific scope for accessibility probes

TPK-02 Test Probe Kit

TPK-02 Medical Test Probe Kit featuring the HLP-01 hazardous live parts probe, test hook, and jointed finger probe for medical device safety evaluation.

Standards references: IEC 60601, CSA 601, UL 2601, and EN 60601.

  • TFP-01 IEC Jointed Finger Probe with banana jack in handle
  • ITB-01 50 mm Impact Test Ball
  • TPP-01 Test Pin Probe, short
  • UFP-02 Rigid Finger Probe
  • BPT-01 Ball Pressure Tester
  • TH-01 Test Hook
  • HLP-01 4.0 mm Hazardous Live Parts Probe
  • Custom-cut foam padded carrying case
  • ISO/IEC 17025 accredited certificate of calibration with specific scope for accessibility probes

TPK-03 Test Probe Kit

TPK-03 Test Probe Kit for laboratory equipment standards including the PCP-01 preset controls probe and rigid finger probe.

Standards reference: IEC 61010.

  • TFP-01 IEC Jointed Finger Probe with banana jack in handle
  • TPP-01 Test Pin Probe, short
  • HLP-01 Hazardous Live Parts Probe
  • UFP-02 Rigid Finger Probe
  • PCP-01 Preset Controls Probe
  • BPT-01 Ball Pressure Tester
  • Custom-cut foam padded carrying case
  • NIST-traceable ISO/IEC 17025 accredited certificate of calibration with specific scope for accessibility probes
  • Measurement uncertainty data available separately

TPK-04 Test Probe Kit

TPK-04 Test Probe Kit containing the THN-01 test thorn probe and 50 mm long test pin probe for household appliance safety standards.

Standards reference: IEC 60335.

  • TFP-01 IEC Jointed Finger Probe with banana jack in handle
  • TPP-01 Test Pin Probe, short
  • TPP-04 Test Pin Probe, long 50 mm
  • UFP-02 Rigid Finger Probe
  • THN-01 Test Thorn Probe
  • BPT-01 Ball Pressure Tester
  • Custom-cut foam padded carrying case
  • NIST-traceable ISO/IEC 17025 accredited certificate of calibration with specific scope for accessibility probes
  • Measurement uncertainty data available separately

TPK-05 Test Probe Kit

TPK-05 IP Code Test Probe Kit featuring 1.0 mm test wire, 2.5 mm test rod, and test sphere probes for ingress protection testing.

Standards references: IEC 60529 and EN 60529.

  • TFP-01 IEC Jointed Finger Probe with banana jack in handle
  • TRP-01 2.5 mm Test Rod
  • TRP-02 1.0 mm Test Wire
  • TSP-01 Test Sphere Probe with handle
  • TSP-02 Test Sphere Probe, small
  • NIST-traceable certificate included
  • ISO/IEC 17025 accredited calibration with data available for an additional fee
  • Custom-cut padded carrying case
  • One-year warranty

TPK-06 Test Probe Kit

TPK-06 test probe kit in two padded carrying cases including child test fingers, test pins, test rods, test hook, impact test balls, and telecom test probe.

Standards references: IEC 60065, EN 60065, and UL 6500.

  • TFP-01 IEC Jointed Finger Probe with banana jack in handle
  • CTF-01 Child Test Finger Probe / Probe 19 of IEC 61032
  • CTF-02 Child Test Finger Probe / Probe 18 of IEC 61032
  • TPP-01 Test Pin Probe, short
  • TPP-03 Test Pin Probe
  • TRP-02 1.0 mm Test Wire Probe / Test Probe D of IEC 61032
  • TRP-01 2.5 mm Test Rod Probe / Test Probe C of IEC 61032
  • UFP-01 Rigid Finger Probe
  • TH-01 IEC Test Hook with means for connection to force gauge
  • ITB-01 50 mm Impact Test Ball with removable eyelet
  • ITB-04 Impact Test Ball with Rockwell Hardness R62+
  • TTP-01 Telecom Test Probe for accessibility to TNV circuits
  • CC-04 Two padded carrying cases
  • NIST-traceable Certificates of Calibration included
  • Measurement data sold separately

Individual Probes

Individual probes are available when a complete kit is not required or when a laboratory needs a specific model for an existing procedure.

Finger Probes & Accessibility Test Probes
Jointed and rigid finger probes for IEC, UL, CSA, and EN accessibility procedures.

View Finger Probes

Specialty Test Probes
Test pins, rods, spheres, wedges, telecom probes, hooks, and other specified probe types.

View Specialty Probes

Frequently Asked Questions

What calibration documentation is included?

Documentation differs by kit. Review the listed contents for the selected model to determine whether the kit includes a certificate, accredited calibration, measurement data, or separately available uncertainty data.

What information should I provide when requesting a kit?

Provide the governing standard, edition, clause, required probe figures, and any calibration-documentation requirements.

Request a Test Probe Kit Quote