Finger Probes & Accessibility Test Probes

ED&D finger probes and accessibility test probes support repeatable verification of protection against access to hazardous parts in electrical safety and ingress-protection test programs. This product group includes the TFP-01 Jointed Finger Probe, UFP-01 / UFP-02 Rigid Finger Probes, ULP-01 UL Finger Probe, ULP-200 Articulated Metal UL Finger Probe, TFP-03 Blender Finger Probe, TFP-04 Articulating Finger Probe, TFP-1089 Jointed Finger Probe, and FNP-01 Fingernail Probe for workflows associated with IEC, EN, UL, and CSA standards.

A horizontal hero banner featuring three precision accessibility test probes: a jointed test finger with a stop plate, a rigid test finger, and an unjointed cylindrical probe for IEC and UL safety standard compliance testing.
IEC 61032 IEC 60529 IEC 60335 IEC 60601 IEC 60950 IEC 61010 UL 60950 UL 1450

Jointed and Rigid Probe Options
Choose articulated IEC- and UL-style fingers for accessibility verification, or rigid probes where the procedure requires more direct insertion force.

Standards-Driven Geometry
Model-specific dimensions, stop faces, palm simulators, and articulation details align with the probe forms referenced in IEC, EN, UL, CSA, and telecom-oriented test programs.

Continuity and Calibration Options
Select models include continuity provision and ISO/IEC 17025 accredited calibration documentation for repeatable lab workflows.

Request a Finger Probe Quote

Let us know the governing standard, required probe figure, whether continuity testing is needed, and whether your lab requires ISO/IEC 17025 accredited calibration documentation.

Finger Probes for Accessibility and Protection-Against-Access Testing

Finger probes are used to verify whether hazardous live parts, moving parts, or other protected areas can be reached during safety evaluation. These probes are common in electrical safety laboratories, product certification test programs, compliance engineering environments, and quality verification workflows where access protection must be checked against a defined probe geometry.

Depending on the governing standard, the required probe may be jointed, rigid, UL-style, appliance-specific, or telecom-specific. Some applications also require continuity checking to confirm contact with a hazardous part, while others require a specific stop face diameter, restricted joint movement, palm simulator, or a special disk or force arrangement.

These probes support workflows associated with IEC 61032, IEC 60529, IEC 60335, IEC 60601, IEC 60950, IEC 61010, UL 60950, UL 1450, CSA 950, EN 61010, and EN 60950. Some of these are legacy standards references but remain relevant for existing products, historical files, and established laboratory methods.

Important standards note: a finger probe is not a general-purpose one-size-fits-all tool. The correct probe must match the exact figure, dimensions, articulation, stop face, continuity provision, and force conditions required by the applicable standard or clause.

Key Probe Types in This Product Group

  • Jointed international test fingers for IEC / EN / CSA and many UL workflows
  • Rigid finger probes for forceful insertion applications
  • UL-specific finger probe designs
  • Application-specific probes for blenders and telecom-related testing
  • Fingernail probes for snap-fit security verification
  • Continuity-ready probe options for contact detection in applicable test programs
  • Calibration-documented probes for repeatable lab workflows

TFP-01 Jointed Finger Probe

TFP-01 Jointed Finger Probe with palm simulator and chrome-plated steel finger, compliant with IEC 61032 Probe B Figure 2 for electrical safety and accessibility testing.

The TFP-01 Jointed Finger Probe is the international test finger used in many IEC-, EN-, CSA-, and UL-related accessibility test workflows. It is built in accordance with IEC 61032 Probe B Figure 2 and is widely used in electrical safety and ingress-protection programs.

Product Details

  • Jointed international test finger configuration
  • Palm simulator included
  • Restricted joint movement
  • Finger made of chrome-plated steel
  • Body / instrument elements made of Delrin®
  • Integral jack in the handle for continuity testing
  • Configured around IEC 61032 Probe B Figure 2

Typical standards references: IEC 60601, IEC 60950, IEC 61010, UL 60950, CSA 950, EN 61010, EN 60950, EN 60529, IEC 60529, and IEC 61032.

Continuity note: this model includes an integral handle jack for continuity testing in workflows where contact confirmation is required.

Selection note: use the TFP-01 when the standard specifically calls for a jointed international-style finger with palm simulator geometry rather than a rigid or UL-specific alternative.

UFP-01 and UFP-02 Rigid Finger Probes

The UFP-01 and UFP-02 are rigid finger probes intended for applications where flexibility would be a hindrance and more forceful insertion is required by the procedure. The UFP family is positioned for IEC-, CSA-, and UL-related accessibility test workflows.

Typical standards references for the rigid probe family: IEC 60601, IEC 60950, IEC 61010, IEC 61032, and UL 1450.

UFP-01 Rigid Finger Probe

UFP-01 Rigid Finger Probe with flash chrome-plated steel finger and Delrin handle, designed for IEC 61032 Probe 11 Figure 7 accessibility testing.
  • Rigid finger-probe configuration for forceful insertion applications
  • Constructed from flash chrome-plated steel with Delrin® components
  • Handle can be threaded for use with force gauges
  • Configured around IEC 61032 Probe 11 Figure 7

Use note: the UFP-01 is suited for procedures where a rigid probe path and more direct force application are preferred over a jointed test finger.

UFP-02 Rigid Finger Probe

UFP-02 Rigid Finger Probe featuring a stainless steel finger and Delrin handle, including ISO/IEC 17025 accredited calibration certificate for IEC 61032 Probe 11 Figure 7 compliance.
  • Rigid finger-probe configuration for forceful insertion applications
  • Constructed from stainless steel with Delrin® handle
  • Includes ISO/IEC 17025 accredited calibration certificate
  • Configured around IEC 61032 Probe 11 Figure 7

Use note: the UFP-02 is selected when articulation would interfere with the intended insertion path or when a more direct rigid probe is required by the test procedure.

ULP-01 UL Finger Probe

ULP-01 UL-style test finger probe with all-nylon construction, featuring a palm simulator and restricted joint movement for UL-oriented accessibility testing.

The ULP-01 UL Finger Probe is the UL-style test finger positioned for product standards that call for the UL finger geometry rather than the IEC articulated international finger. It uses all-nylon construction, includes a palm simulator, and features restricted joint movement.

Product Details

  • UL-style test finger configuration
  • Palm simulator included
  • Restricted joint movement
  • All-nylon construction
  • Designed for UL-oriented finger-probe workflows

Selection note: choose the ULP-01 only when the governing UL method calls for the UL finger design. It should not automatically be substituted for IEC / EN articulated finger requirements.

ULP-200 Articulated Metal UL Finger Probe

ULP-200 Articulated Metal UL Finger Probe with high-precision aluminum body and stainless steel tip, including ISO/IEC 17025 accredited calibration certificate.

The ULP-200 is an articulated metal UL finger probe intended for UL-oriented accessibility test programs that require a standard articulated finger configuration with durable metal construction and continuity provision to the tip.

Product Details

  • UL articulated finger configuration
  • High-precision machined aluminum body
  • Stainless steel tip
  • Continuity provision to the tip
  • Includes ISO/IEC 17025 accredited certificate of calibration

Typical fit: UL-style accessibility testing where articulated metal construction and continuity-to-tip capability are required for repeatable lab use.

TFP-03 Jointed Finger Probe for Blenders

ED&D TFP-03 Jointed Finger Probe for blenders, featuring a 125mm circular stop face and 100mm probe length for IEC 60335 appliance safety testing.

The TFP-03 is a jointed finger probe for blender-related testing intended to verify basic protection against access to hazardous parts and access with a finger in appliance-specific workflows. This probe uses a larger circular stop face than the standard IEC finger arrangement.

Product Details

  • Used to verify protection against access to hazardous parts
  • Used to verify protection against access with a finger in blender-related applications
  • Circular stop face diameter: 125 mm
  • Distance from probe tip to stop face: 100 mm
  • Application-specific articulated finger geometry

Typical standard reference: IEC 60335.

Application note: this is a special-purpose probe for appliance-related blender access testing and should not be treated as interchangeable with the general international finger probe.

TFP-04 Articulating Finger Probe

TFP-04 Articulating Finger Probe for IEC accessibility testing, featuring a 50mm diameter circular stop face and Delrin handle with integrated continuity jack.

The TFP-04 is an IEC articulating finger probe that uses a circular stop face with a 50 mm diameter in place of the non-circular face found on other probe forms. It is intended for accessibility testing workflows that require this alternate stop-face arrangement.

Product Details

  • IEC articulating finger-probe style
  • Circular stop face diameter: 50 mm
  • Alternative stop-face geometry relative to the more typical non-circular arrangement
  • Includes ISO/IEC 17025 accredited certificate of calibration
  • Includes 1-year warranty

Calibration note: this model includes accredited calibration documentation to support repeatable accessibility testing and lab recordkeeping.

Selection note: confirm that the procedure requires the circular stop-face version before selecting the TFP-04 over other articulated finger variants.

TFP-1089 Jointed Finger Probe

ED&D TFP-1089 Jointed Finger Probe for telecom testing, featuring a 10mm extended finger, specialized disk, and no palm simulator, compliant with GR-1089 requirements.

The TFP-1089 is a jointed finger probe intended for telecom-oriented requirements referenced by GR-1089. It differs from typical IEC and UL probes by using a finger that is 10 mm longer and by omitting the simulated palm, while keeping the remaining dimensions aligned with IEC / UL-style geometry.

Product Details

  • Precision made of Delrin® and flash chrome-plated steel
  • Finger is 10 mm longer than standard IEC / UL-style probe versions
  • No simulated palm
  • Remaining dimensions aligned with IEC / UL-style geometry
  • Special disk required by GR-1089 requirements
  • Banana jack in the handle for continuity checking
  • Includes certificate of calibration

Application note: this probe and its special disk are intended for GR-1089-related workflows rather than standard IEC or UL finger-probe substitution.

Selection note: choose the TFP-1089 only when the telecom-oriented requirement specifically calls for the modified geometry and associated disk.

FNP-01 Fingernail Probe

FNP-01 Fingernail Probe with stainless steel construction, hardened tip, and spring-loaded Delrin handle for checking the security of snap-together parts.

The FNP-01 Fingernail Probe is intended to check the security of parts that snap together in appliance-related safety testing. It uses a spring-loaded handle arrangement that can be calibrated to the required force.

Product Details

  • Used to check the security of snap-together parts
  • Spring-loaded handle
  • Spring loading can be calibrated to the required force
  • Stainless steel construction
  • Specially hardened tip
  • Delrin® handle

Typical standard reference: IEC 60335.

Use note: this probe is intended for snap-fit security verification and should be used with the force level required by the applicable standard or lab method.

Which Finger Probe Is Right for Your Lab?

Model Primary Use Best Fit Key Differentiator
TFP-01 International articulated accessibility testing IEC / EN / CSA and many UL-related finger access workflows Palm simulator, restricted joint movement, continuity jack, IEC 61032 Probe B style
UFP-01 / UFP-02 Rigid accessibility testing Forceful insertion applications Rigid construction; UFP-02 includes ISO/IEC 17025 accredited calibration certificate
ULP-01 UL finger access testing UL-specific finger-probe methods All-nylon UL-style finger with palm simulator
ULP-200 UL articulated metal finger testing UL workflows needing articulated metal construction and continuity capability Machined aluminum body, stainless tip, continuity to tip, accredited calibration
TFP-03 Blender / appliance-specific access testing IEC 60335 blender-related workflows 125 mm circular stop face and 100 mm tip-to-stop-face distance
TFP-04 Articulated finger access testing Procedures requiring a 50 mm circular stop face Circular stop-face variant with accredited calibration documentation
TFP-1089 Telecom-oriented access testing GR-1089-related workflows 10 mm longer finger, no palm, special disk, continuity jack
FNP-01 Snap-fit security verification IEC 60335-related fingernail / pry-style checks Spring-loaded fingernail probe with force-calibratable handle

Selection guidance: choose the TFP-01 for general international articulated finger requirements, the UFP family for rigid insertion applications, the ULP models for UL-specific finger methods, the TFP-03 or TFP-04 for special stop-face arrangements, the TFP-1089 for GR-1089-related geometry, and the FNP-01 for fingernail / snap-fit checks.

Frequently Asked Questions

What is a finger probe used for?

A finger probe is used to verify whether hazardous parts or protected internal areas can be accessed under the geometry and conditions defined by the governing safety standard.

What is the difference between a jointed and rigid finger probe?

A jointed finger probe simulates articulated finger movement, while a rigid finger probe is used where flexibility would interfere with the required insertion or force application.

When should a lab use the TFP-01 instead of a UL finger probe?

The TFP-01 should be used when the standard calls for the international articulated finger configuration, such as IEC 61032 Probe B style, rather than a UL-specific finger design.

Why would a probe need continuity provision?

Continuity provision allows the lab to verify electrical contact when the probe reaches a hazardous part, which can be required in certain accessibility test workflows.

Are IEC 60950, EN 60950, and CSA 950 still relevant?

Yes, as legacy references. They remain relevant for older products, historical compliance files, and established lab procedures that still reference those standards.

Can one finger probe be used for every access test?

No. The required probe depends on the exact standard, figure, dimensions, articulation, stop face, force condition, and continuity requirements of the test method.

Talk to ED&D About Finger Probes

Tell us the exact standard and figure you need to test to, and whether your lab requires continuity provision, rigid insertion, or accredited calibration.

Typical Finger Probe Testing Applications

ED&D finger probes and accessibility probes are used across electrical safety laboratories, product certification programs, compliance engineering teams, and quality verification environments where protection against access to hazardous parts must be checked with a defined probe geometry.

Depending on the product and governing method, these workflows may relate to IEC 61032, IEC 60529, IEC 60335, IEC 60601, IEC 60950, IEC 61010, UL 60950, UL 1450, CSA 950, EN 61010, and EN 60950.

  • Protection-against-access verification for electrical equipment
  • Ingress-protection related finger access checks
  • Medical, lab, and information-technology equipment safety workflows
  • UL-oriented accessibility testing
  • Rigid-probe insertion testing
  • Continuity-based contact verification on applicable probe models
  • Appliance-specific blender access testing
  • Snap-fit security checks using fingernail probes
  • Telecom-oriented GR-1089-style accessibility verification

Selection note: always match the probe to the exact figure and clause required by the governing standard, including stop-face geometry, articulation type, force arrangement, and continuity requirement.