Specialty Test Probes
ED&D specialty test probes are used for accessibility, enclosure-protection, moving-part, appliance, telecom, and surface-temperature procedures that specify a particular probe geometry.
Probe selection: use the exact standard, edition, clause, figure, IP designation, probe geometry, and test condition required by the applicable procedure.
Probe Selection and Use
Specialty probes are used when a test procedure specifies a geometry other than a common articulated finger probe. Depending on the method, the probe may be used to evaluate access through an opening, access to a hazardous live or moving part, enclosure protection, tool access, appliance-specific hazards, or controlled contact during surface-temperature measurement.
Test Pin Probes
TPP-01 Short Test Pin Probe
Stainless steel test pin with Delrin® handle and stop face.
Referenced as IEC 61032 Probe 13, Figure 9. References also include IEC 60601, IEC 60950, and IEC 61010.
TPP-03 Test Pin Probe
Test pin probe for procedures referencing IEC 60065.
TPP-04 Long Test Pin Probe
Stainless steel test pin with Delrin® handle and stop.
Referenced as IEC 61032 Probe 12, Figure 8. NIST-traceable calibration documentation is available, with ISO/IEC 17025 accredited calibration offered as an option.
Test Rod and Test Sphere Probes
TRP-01 2.5 mm Test Rod
2.5 mm test rod for the referenced access-probe procedures.
IEC 61032 Probe C, Figure 3; referenced for IEC 60529 and EN 60529 IP3 and additional-letter C procedures.
TRP-02 1.0 mm Test Rod
1.0 mm test rod for the referenced access-probe procedures.
IEC 61032 Probe D, Figure 4; referenced for IEC 60529 and EN 60529 IP4 and additional-letter D procedures.
TRP-04 Test Rod Probe
Probe for evaluating protection against access to hazardous mechanical parts.
Referenced as IEC 61032 Probe 31, Figure 14.
TRP-05 Test Rod Probe
Referenced as IEC 61032 Probe 32, Figure 15.
ISO/IEC 17025 accredited calibration documentation is available.
TRP-06 Test Rod Probe
1/16 in. diameter rod probe with a hemispherical end.
TSP-01 Test Sphere Probe
Sphere probe for IP1 and additional-letter A procedures.
TSP-02 Test Sphere
Hardened steel sphere with chrome finish used for IP2 enclosure protection procedures.
Referenced as IEC 61032 Probe 2, Figure 6.
Special Access and Tool-Simulation Probes
RTR-01 Rigidity Test Rod Probe
Used for enclosure rigidity testing.
Referenced to Clause 8.1 of IEC 1010.
TUP-01 Uninsulated Live Parts Probe
Probe for evaluating access to uninsulated live parts.
EWP-01 Enameled Wire Probe
Probe for evaluating access to enamel-coated wire, including wire in transformers and inductors.
AWP-01 Wedge Probe
Jointed accessibility wedge probe for paper document shredder testing.
References UL 60950-1 Annex NAF for paper shredder testing.
TTP-01 Telecom Test Probe
Used to check limited access to telecommunications voltages, primarily at telephone jacks and operator-access areas.
References include IEC 60950, IEC 60065, UL 60950, CSA 950, and EN 60950.
PCP-01 Preset Controls Probe
Probe for access through openings provided for preset controls.
References include IEC 1010, EN 61010-1, UL 3101-1, UL 3111-1, and CSA 1010-1.
THN-01 Test Thorn Probe
Used for accessibility testing of appliances with visibly glowing heating elements and parts supporting those elements.
Referenced as IEC 61032 Probe 41, Figure 16.
TH-01 Test Hook Probe
Used on enclosures before accessibility testing. The hook is inserted into a vent or seam and pulled with the force specified by the applicable procedure.
Referenced for IEC 60601 procedures.
HLP-01 Hazardous Live Parts Probe
Probe for evaluating access to hazardous parts through top openings.
References include IEC 60601, IEC 61010, IEC 1010, EN 61010-1, UL 3101-1, and CSA 1010-1.
Application-Specific Probes
CTP-01 Coax Test Plug
Coax test plug for procedures addressing hazardous live parts accessible through antenna coaxial sockets, including endurance, impact, and torque procedures.
Referenced for IEC 60065:2000 procedures.
HMP-01 Hazardous Moving Parts Probe
Probe for evaluating access to hazardous moving parts, such as fan blades through a finger guard.
HBP-102 Blender Probe
Blender probe for IEC 60335-2-14, Clause 20.102. Stainless steel rod, 8.0 mm diameter by 80 mm long.
HBP-103 Blender Probe
Blender probe for IEC 60335-2-14, Clause 20.103. 40 mm diameter rod with a hemispherical end at 120 mm length.
BEP-01 Blunt End Probe
Blunt end probe for procedures that specify this probe geometry.
TW-01 Test Wire
Test wire for procedures addressing access to hazardous live parts of electrical toys and access with a tool.
Referenced as IEC 61032 Probe 17, Figure 11 for IEC 60529 IP3 and additional-letter C procedures.
FBC-639 Metal Cylinder Probe
Metal cylinder probe used to evaluate enclosure openings against the specified small-rodent ingress requirement.
Surface Temperature Probe
STP-01 Surface Temperature Probe
Probe attachment for surface-temperature measurement with compatible ED&D platforms. The probe has a 10-32 tapped handle for attachment to compatible ED&D gauges.
Product reference: IEC 60335-2-6/FDIS:2002 for appliance surface-temperature evaluation.
Method note: confirm the required contact geometry, measurement instrument, standard edition, and governing clause before selecting the probe setup.
Frequently Asked Questions
What information should I provide when requesting a probe?
Provide the standard, edition, clause, figure, IP designation, product category, and any required probe dimensions or test conditions available in your procedure.
Why does this page include older standard references?
Older references may apply to legacy products, existing certification files, or laboratory procedures that cite those editions.
Is calibration documentation available?
Calibration documentation is identified on this page only for models where it is stated as available. Confirm the required documentation when requesting a quote.
Include the standard, edition, clause, and figure with your request.